Helios Dual Beam

FEI

FEG HRSEM and Focused Ion Beam, ETD and TLD detectors

DBS/CBIS houses a FEI Helios Dual Beam in S1 Level 2. It has a focused ion beam (Ga) and electron beam (FEG) SEM. It is used for slice-and-view for large volume 3D tomography, up to several hundreds of microns. It bridges the gap between Laser confocal and TEM tomography.

Location: CBIS CryoEM Microscopy Laboratory
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